ESD events are notoriously difficult to simulate; test chips burn time and money, and do not address power bussing issues; design rules are meant to be broken; and innovation often occurs at the ...

IC designers need to test devices for ESD immunity. The transmission-line-pulse (TLP) method has gained popularity because of the repeatable waveforms it produces. The TLP method requires charging of ...

Electrostatic discharge (ESD) is the sudden transfer of static electricity between two objects with different charge potentials, typically caused by near contact. Even the smallest discharge can ...

The NSG 438 electrostatic discharge (ESD) simulator system has an elevated discharge voltage of 30 kV, exceeding industry ESD test standards requiring 25-kV pulse voltages. The ...

The low clamping voltage improves protection of system level ESD testing as chipsets evolve into geometries below 20 nm, making them more sensitive to transient voltage.