TOKYO, May 18, 2026 (GLOBE NEWSWIRE) -- Advantest Corporation (TSE Prime: 6857), a global leader in semiconductor test solutions, today announced it will showcase the integration of AllianceATE’s ...
Tessent Cell-Aware ATPG is a transistor-level ATPG-based test methodology that achieves significant quality and efficiency improvements by directly targeting specific shorts; opens and transistor ...
At this year’s International Test Conference (October 10-15, 2021), Siemens Digital Industries Software is showcasing IC test and lifecycle management technologies that address the key scaling ...
September 11, 2013. Mentor Graphics Corp. announced at the International Test Conference that ASIC design company Open-Silicon has used the Tessent TestKompress product with Cell-Aware Test to improve ...
Global leader in design-for-test (DFT) technology paves the way for mainstream adoption of 3D ICs Innovative solution dramatically streamlines DFT cycles for highly complex multi-die designs PLANO, ...
While semiconductor design engineers become more aware of silent data corruption (SDC) or silent data errors (SDE) caused by aging, environmental factors, and other issues, embedded test solutions are ...
There's a growing demand for next-generation ICs to deliver the extreme performance required for fast-evolving applications, such as AI and self-driving cars, putting tremendous pressure on the size ...
Mentor Graphics has announced the Tessent product line, under which the company will integrate its portfolio of test and yield-analysis products and connect them into a single platform. The products ...
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