STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...

The importance of properly integrating test points into a PCB design. Test-point deployment considerations. When it comes to creating a modern electronic design, we live in both the best and the worst ...

New market study finds that the top six manufacturers of Wafer Test Probe Card occupied nearly 72.09% global market share. LEWES, DELAWARE, UNITED STATES, November 30 ...

The PTT pocket temperature test probes measure surface or immersion temperatures in degrees Celsius or Fahrenheit. The TPP1 immersion probes and TPP2 surface-area probes measure from −50°C to 250°C ...

Over the last few decades, electronic devices have drastically changed. Radios that once had point-to-point wiring gave way to printed circuit boards with through-hole parts, and now microscopic ...

[Piffpaffpoltrie] had a problem. They found the InLine VA40R to be a perfectly usable multimeter, except for a couple of flaws. Most glaring among these were the tiny sockets for the test probes.

Seamlessly integrated system combines TITAN™ Probes and MPI's wafer-level expertise to unlock precision measurements for next-generation semiconductors and sub-THz applications This latest milestone ...

STAr Technologies, a leading manufacturer of semiconductor test probe cards, unveiled the new 3D/2.5D MEMS micro-cantilever probe card for WAT reliability testing. The Virgo-Prima Series probe card is ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

Livermore, Calif.—FormFactor Inc. has developed a family of advanced wafer probe cards designed to address the rising cost and technology challenges associated with testing wire bond logic and ...

Test is a dirty business. It can contaminate a unit or wafer, or the test hardware, which in turn can cause problems in the field. While this has not gone unnoticed, particularly as costs rise due to ...