About a dozen years ago, the world of test had reached an economic impasse: most digital designs had become sufficiently complex that standard scan testing techniques were no longer cost-effective.

ScanExpress JET bridges the gap between JTAG and functional test methods, providing a superior solution to customers requiring the highest test coverage ScanExpress JET carries existing boundary-scan ...

Companies specializing in circuit board and system design-for-test (DFT) tools are pursuing a variety of strategies to serve test and debug applications based on innovations they announced over the ...