The size of designs continues to grow and IC manufacturers are pushing for higher test quality, especially in mission-critical applications such as transportation and medicine. More advanced nodes ...
Compression testing is used to determine how a product or material reacts when it is compressed, squashed, crushed or flattened by measuring fundamental parameters that determine the specimen behavior ...
Scan technology is essential for testing the digital content of large-volume devices. By using scan, you can make the device itself responsible for some of the “test” chores, and you can shorten the ...
MOUNTAIN VIEW, Calif., June 11, 2013-- Synopsys, Inc. (Nasdaq: SNPS), a global leader providing software, IP and services used to accelerate innovation in chips and electronic systems, today unveiled ...
The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...
The ability to control test cost while design sizes have grown exponentially is a success story that relies on the invention and continuous improvement of embedded test compression. One way test ...
Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
High quality and versatile Compression Testing Machine with certification of a UKAS accredited calibration. The Compression Testing machine CRT-CTM250-II was developed to perform a variety of ...
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