Design for Test (DFT) managers often must make difficult and sometimes costly trade-offs between test implementation effort and manufacturing test cost. The traditional method for evaluating these ...

The reality of DFT for large and complex SoCs has introduced new risk into design schedules. DFT teams end up in the critical path to tape out while waiting for portions of the design to be complete, ...

Bus-based scan data distribution architecture enables true bottom-up DFT flows, writes Geir Eide of Siemens Digital Industries Software. The dramatic rise in manufacturing test time for today’s large ...