Nasdaq

Keysight’s New Parallel Parametric Test System Delivers High Throughput and Cost-Effective Wafer Test

SANTA ROSA, Calif.--(BUSINESS WIRE)-- Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...
Nasdaq

Tektronix Introduces S530 Parametric Test System with KTE V7.1 Software to Speed Semiconductor Chip Production

BEAVERTON, Ore., Sept. 16, 2021 /PRNewswire/ -- Tektronix, Inc., a leading worldwide provider of test and measurement solutions, today released KTE V7.1 software for the Keithley S530 Series ...
Electronic Design

DC/RF Parametric Probe Cards Get Down To 45 nm

Taking a swipe at the cost of ownership, two additions to the Pyramid parametric probe card family allow single-pass DC and RF measurements, promising to reduce the cost of parametric production test ...
EDN

System performs one-pass wafer test up to 3 kV

Keysight’s 4881HV wafer test system enables parametric tests up to 3 kV, accommodating both high and low voltage in a single pass. Its high-voltage switching matrix facilitates this one-pass operation ...
Semiconductor Engineering

Using Test And Metrology Data For Dynamic Process Control

Advanced packaging is transforming semiconductor manufacturing into a multi-dimensional challenge, blending 2D front-end wafer fabrication with 2.5D/3D assemblies, high-frequency device ...