(Nanowerk News) Turning up the intensity of x-ray beams used to probe the atomic structures of materials can actually reduce the intensity of x-rays scattered from the material, a RIKEN-led team has ...

The SACLA free-electron laser facility, where the experiment on the diffraction of ultra-short X-ray pulses on crystalline silicon samples was carried out. When we illuminate something, we usually ...

Light fields, as a form of electromagnetic waves, are characterized by fundamental parameters including intensity, phase, and polarization. Precise imaging of these three parameters is crucial for ...

X-ray crystallography, like mass spectroscopy and nuclear spectroscopy, is an extremely useful material characterization technique that is unfortunately hard for amateurs to perform. The physical ...

XRD works by directing X-rays onto a crystalline material and analyzing the angles and intensities of the diffracted beams. The atomic planes within the crystal act as a three-dimensional grating, ...

The SACLA free-electron laser facility, where the experiment on the diffraction of ultra-short X-ray pulses on crystalline silicon samples was carried out. Credit: SACLA The SACLA free-electron laser ...