LSI Logic’s new Iddalyzer automated design-for-test (DFT) methodology for ASICs complements existing chip-test methodologies, such as scan or built-in self-test. The methodology thus lets you increase ...
Inovys Corp. announced it has contracted Q-star Test of Belgium to develop advanced IDDQ test capabilities for its latest design-for-test (DFT) test system. Q-star will provide advanced ...
Combining these Apps with an emulation environment makes it possible to increase fault coverage, increase production yield, and reduce ATE test time and cost. The design-for-test (DFT) technology was ...
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