The B4655A FPGA dynamic probe application works with the company’s logic analyzers to debug Xilinx FPGAs, including the Virtex-II, Virtex-II Pro, and Spartan-3 families. Interacting with on-chip ...

As with most successful technologies over the past few decades, test equipment has improved rapidly to adapt to ever changing requirements. When you look under the hood of a new car, for instance, you ...

If you're working with a high-speed digital design, you likely face formidable measurement challenges every day. Unfortunately, in spite of tight project schedules and highly constrained budgets, ...

The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...

Test facilities are beginning to implement real-time maintenance, rather than scheduled maintenance, to reduce manufacturing costs and boost product yield. Adaptive cleaning of probe needles and test ...

The field strength used to determine radiated immunity must be accurately monitored during any test although the levels vary greatly from consumer to military applications. At high frequencies, this ...