Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.
The high sensitivity of the reflection electron microscopy (REM) technique to small changes in the crystal structure and composition of the top surface layers of various crystalline materials makes it ...
Thermo Scientific Iliad integrates electron energy loss spectroscopy (EELS) and NanoPulser electrostatic beam blanker to improve insights at the atomic level WALTHAM, Mass.--(BUSINESS WIRE)--Thermo ...
SiC is extensively used in microelectronic devices owing to its several unique properties. However, low yield and high cost of the SiC manufacturing process are the major challenges that must be ...
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