In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is ...
Publications of the Astronomical Society of the Pacific, Vol. 133, No. 1021 (2021 March), pp. 1-12 (12 pages) In this paper we present a two-step neural network model to separate detections of solar ...
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