Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

There is a rapidly growing interest in the use of structural techniques for testing random logic. In particular, much has been published on new techniques for on-chip compression of automatic test ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Mountain View, CA. Synopsys Inc. at ITC announced a new, breakthrough ATPG and diagnostics technology that delivers 10X faster run time and 25% fewer test patterns to shorten schedules, accelerate ...