There is a rapidly growing interest in the use of structural techniques for testing random logic. In particular, much has been published on new techniques for on-chip compression of automatic test ...
Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.
The semiconductor industry has long relied on scan ATPG (automatic test pattern generation) tools instead of functional test to create stimulus-response patterns with very high fault coverage. But ...
The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...
WILSONVILLE, Ore., May 18, 2015 -- Mentor Graphics Corp. (NASDAQ: MENT) today announced that Mellanox Technologies has standardized on the new Mentor® Tessent® Hierarchical ATPG solution to manage the ...
For testing complex chip designs it makes sense to combine the two most common test methodologies -logic built-in self-test (LBIST) and automatic test pattern generation (ATPG), writes Amer ...
Recent and continuing trends in the semiconductor industry pose challenges to IC test-data volumes, test application times, and test costs. The industry has thus far succeeded in containing test costs ...
Yield ramp has always been a concern in semiconductor manufacturing: systems companies need confidence that devices meet ...
The ability to create and choose the most effective test patterns has become more daunting as more patterns are introduced, says Ron Press of Siemens Digital Industries. Choosing the most efficient ...
There is a rapidly growing interest in the use of structural techniques for testing random logic. In particular, much has been published on new techniques for on-chip compression of automatic test ...
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