As semiconductor applications in automotive, data center, and high-performance computing grow increasingly mission-critical, the industry faces mounting pressure to achieve near-perfect manufacturing ...

•Average fault coverage for randomly generated test vectors was 60% or better depending on the type of circuit and the number of vectors applied (Max 98% or better). •Fault coverage for test vectors ...

Historically, testability is an afterthought in the design process. But heightening complexity of chip designs, and especially SoCs, forces testability (and manufacturability) to take a more central ...

In its latest version, FastScan 2001 automatic test pattern generation (ATPG) tool reportedly can reduce test pattern sizes by as much as 60%. It can also test small embedded memories and other macros ...